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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 21, Iss. 5 — Mar. 1, 1982
  • pp: 778–781

Improvement in resolution by nearly confocal microscopy

I. J. Cox, C. J. R. Sheppard, and T. Wilson  »View Author Affiliations


Applied Optics, Vol. 21, Issue 5, pp. 778-781 (1982)
http://dx.doi.org/10.1364/AO.21.000778


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Abstract

In a conventional confocal microscope the resolution is improved over that attainable in a conventional instrument. A further improvement in resolution is produced when the detector pinhole is offset resulting in nearly confocal operation. For the case where the pinhole is placed over the first dark ring in the Airy disk in the detector plane, dark-field conditions are produced by a very simple method.

© 1982 Optical Society of America

History
Original Manuscript: September 4, 1981
Published: March 1, 1982

Citation
I. J. Cox, C. J. R. Sheppard, and T. Wilson, "Improvement in resolution by nearly confocal microscopy," Appl. Opt. 21, 778-781 (1982)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-21-5-778

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