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Applied Optics

Applied Optics


  • Vol. 22, Iss. 1 — Jan. 1, 1983
  • pp: 17–19

Bragg reflectivity of layered synthetic microstructures in the x-ray anomalous scattering regions

R. Marmoret and J. M. André  »View Author Affiliations

Applied Optics, Vol. 22, Issue 1, pp. 17-19 (1983)

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No abstract available.

Original Manuscript: June 25, 1982
Published: January 1, 1983

R. Marmoret and J. M. André, "Bragg reflectivity of layered synthetic microstructures in the x-ray anomalous scattering regions," Appl. Opt. 22, 17-19 (1983)

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  1. Y. Cauchois, C. R. Acad. Sci. 242, 100 (1956); Y. Cauchois, C. Bonnelle, C. R. Acad. Sci. 242, 1596 (1956).
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  5. J. M. André, A. Maquet, R. Barchewitz, Phys. B 25, 5671 (1982).
  6. R. W. James, Optical Principles of the Diffraction of X rays (Bell, London, 1948).
  7. B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuro, R. K. Fujikawa, At. Data Nucl. Data Tables 27 No. (1) (1982). [CrossRef]
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  10. A. Maquet, R. Barchewitz, R. Marmoret, J. M. André, Phys. Rev. B (to be published).
  11. A. E. Rosenbluth, J. M. Forsyth, “Low Energy X-ray Diagnostics,” in AIP Conf. Proc. 75, P. T. Attwood, B. L. Henke, Eds. (AIP, New York, 1981).
  12. The terms refers in this case to the coherent absorption; i.e., only the real part of the scattering factor is involved.
  13. W. H. Zachariasen, Theory of X-ray Diffraction in Crystals (Wiley, New York, 1945).

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