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Applied Optics

Applied Optics


  • Vol. 22, Iss. 1 — Jan. 1, 1983
  • pp: 185–189

Optical constants in the IR from thin film interference and reflectance: the reststrahlen region of muscovite mica

Edgar B. Singleton and Charles T. Shirkey  »View Author Affiliations

Applied Optics, Vol. 22, Issue 1, pp. 185-189 (1983)

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A new technique for determining the IR optical constants of materials that can be formed into thin films is presented. At a given wavelength the thickness of the film t, the index of refraction n, and the extinction coefficient k combine to produce interference effects in the film, which in turn control reflectance from the film. When reflectance is plotted vs thickness the resultant curve is a unique function of n and k. Values of n and k are determined by curve fitting. The technique is illustrated using thin films of muscovite mica, and values of n and k are reported for wave numbers from 1200 to 400 cm−1, which include the reststrahlen region of mica.

© 1983 Optical Society of America

Original Manuscript: August 19, 1982
Published: January 1, 1983

Edgar B. Singleton and Charles T. Shirkey, "Optical constants in the IR from thin film interference and reflectance: the reststrahlen region of muscovite mica," Appl. Opt. 22, 185-189 (1983)

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  1. O. S. Heavens, Optical Properties of Thin Solid Films (Butterworth, London, 1955), Sect. 4.
  2. See, for example, M. Born, K. Huang, Dynamical Theory of Crystal Lattices (Oxford U. P., London, 1954), pp. 116–128.
  3. D. E. Gray, Ed., American Institute of Physics Handbook (McGraw-Hill, New York, 1972).
  4. A. Hjortsberg, C. G. Granquist, Appl. Opt. 19, 1694 (1980). [CrossRef] [PubMed]
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  6. P.-O. Nilsson, Appl. Opt. 7, 435 (1968). [CrossRef] [PubMed]
  7. W. Driscoll, Ed., Handbook of Optics (McGraw-Hill, New York, 1978), p. 10–108.
  8. W. Vedder, Am. Mineral. 49, 736 (1964).

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