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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 10 — May. 15, 1983
  • pp: 1519–1529

X-ray spectrograph design

Michael P. Chrisp  »View Author Affiliations


Applied Optics, Vol. 22, Issue 10, pp. 1519-1529 (1983)
http://dx.doi.org/10.1364/AO.22.001519


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Abstract

An aberration theory is applied to spectrograph design. The initial system considered has a toroidal mirror in front of a concave grating spectrograph, giving spatial resolution perpendicular to the dispersion direction. The accuracy of the theory is shown by comparison of spot diagrams obtained from the aberrations with those produced by raytracing. The major aberrations affecting the vignetting at the intermediate slit and the spatial resolution are identified. A new system, using a holographic grating to give a flat focal plane, is then designed and optimized. It has increased spatial resolution over the wavelength range and is particularly suitable for microchannel array detectors.

© 1983 Optical Society of America

History
Original Manuscript: November 18, 1982
Published: May 15, 1983

Citation
Michael P. Chrisp, "X-ray spectrograph design," Appl. Opt. 22, 1519-1529 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-10-1519

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