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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 10 — May. 15, 1983
  • pp: 1551–1554

Electron–photon coincidence technique for the absolute calibration of VUV detectors

R. McAdams and S. K. Srivastava  »View Author Affiliations


Applied Optics, Vol. 22, Issue 10, pp. 1551-1554 (1983)
http://dx.doi.org/10.1364/AO.22.001551


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Abstract

A method is described whereby VUV photon detectors can be accurately calibrated. This method is illustrated by taking the 58.4-nm transition of He as an example. The technique consists of crossing a monoenergetic electron beam with a beam of He atoms. When inelastically scattered electrons which have excited the 21P state are detected in coincidence with the 58.4-nm photons emitted in the decay of the excited state, the interaction volume formed by the crossed beams constitutes a standard source of photons. By comparing the number of detected coincidences with the predicted number the calibration can be made. A total detector efficiency of 0.024 ± 0.003 is obtained for a Galileo 4830 channeltron.

© 1983 Optical Society of America

History
Original Manuscript: January 22, 1983
Published: May 15, 1983

Citation
R. McAdams and S. K. Srivastava, "Electron–photon coincidence technique for the absolute calibration of VUV detectors," Appl. Opt. 22, 1551-1554 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-10-1551

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