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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 12 — Jun. 15, 1983
  • pp: 1820–1823

Ray tracing method for refractive index profiling

Dennis Gregoris and Keigo Iizuka  »View Author Affiliations


Applied Optics, Vol. 22, Issue 12, pp. 1820-1823 (1983)
http://dx.doi.org/10.1364/AO.22.001820


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Abstract

A technique is proposed to measure cylindrically symmetric refractive index profiles of transparent rods. A probe ray is incident to the side of the rod, and its emergent point is observed on an end surface of the rod. A simple relationship between incident and emergent ray positions is used to determine the index profile. The profile of a graded index rod lens was measured with an accuracy to within 1 part in 103. An extension of the method to a more general profile distribution is discussed.

© 1983 Optical Society of America

History
Original Manuscript: February 23, 1983
Published: June 15, 1983

Citation
Dennis Gregoris and Keigo Iizuka, "Ray tracing method for refractive index profiling," Appl. Opt. 22, 1820-1823 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-12-1820

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