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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 12 — Jun. 15, 1983
  • pp: 1879–1886

Ray-trace analysis and data reduction methods for the Ritchey-Common test

K. L. Shu  »View Author Affiliations


Applied Optics, Vol. 22, Issue 12, pp. 1879-1886 (1983)
http://dx.doi.org/10.1364/AO.22.001879


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Abstract

The relationships between figure errors on an optical flat and wave-front aberrations when the flat is tested in the Ritchey-Common configuration are examined by the real ray-tracing lens analysis program polycon. A new data reduction method for the test is demonstrated. The test is simulated, and rays are traced using polycon. Unit magnitude Zernike term surface errors are added, one by one, to the flat under simulated test, and the effect on the wave front is derived by real ray tracing. This results in a table of influence functions for the particular test geometry. The simulation is repeated for one or more different field angles or azimuthal rotations of the flat to obtain other sets of influence functions. By using these influence functions it is possible to deduce what surface errors on the flat are responsible for any arbitrary test wave-front errors measured up to the order of the influence functions derived. The effectiveness of this method is compared with other existing methods by computer simulations.

© 1983 Optical Society of America

History
Original Manuscript: February 8, 1983
Published: June 15, 1983

Citation
K. L. Shu, "Ray-trace analysis and data reduction methods for the Ritchey-Common test," Appl. Opt. 22, 1879-1886 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-12-1879

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