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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 15 — Aug. 1, 1983
  • pp: 2322–2325

Evaluation of effective emissivities of nonisothermal cavities

Yoshiko Ohwada  »View Author Affiliations


Applied Optics, Vol. 22, Issue 15, pp. 2322-2325 (1983)
http://dx.doi.org/10.1364/AO.22.002322


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Abstract

Local effective spectral and total emissivities of nonisothermal cavities having diffuse surfaces are evaluated. The effective emissivity of the cavity wall around the half-depth of a cylinder is little affected by a linear decrease or increase of temperature along the cavity axis because of a compensation effect. The nonisothermal effect on the integrated cavity emissivity changes considerably with cavity geometry for a given temperature distribution.

© 1983 Optical Society of America

History
Original Manuscript: January 26, 1983
Published: August 1, 1983

Citation
Yoshiko Ohwada, "Evaluation of effective emissivities of nonisothermal cavities," Appl. Opt. 22, 2322-2325 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-15-2322


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References

  1. R. E. Bedford, C. K. Ma, J. Opt. Soc. Am. 64, 339 (1974). [CrossRef]
  2. R. E. Bedford, C. K. Ma, J. Opt. Soc. Am. 65, 565 (1975). [CrossRef]
  3. R. E. Bedford, C. K. Ma, J. Opt. Soc. Am. 66, 724 (1976). [CrossRef]
  4. Y. Ohwada, J. Opt. Soc. Am. 71, 106 (1981). [CrossRef]
  5. Equation (2) in the text is identical to the following summation derived in Refs. 1–3: Mn(Q)=ε+ρ∑P=1NMn−1(P)⋅df(Q,P) (see Ref. 4).
  6. E. M. Sparrow, R. D. Cess, Radiation Heat Transfer (Brooks/Cole, Belmont, Calif., 1966).
  7. The quantity α in Refs. 8 and 9 is the angle between the cavity axis and the line where a plane containing the cavity axis intersects dQ and related to β in the text by α = π/2 − β.
  8. Y. Ohwada, Appl.Opt. 20, 3332 (1981). [CrossRef] [PubMed]
  9. Y. Ohwada, Temperature, Its Measurement and Control in Science and Industry (American Institute of Physics, New York, 1982), Vol. 5, Part 1, p. 517.
  10. C. Shouren, C. Zaixiang, C. Hongpan, Metrologia 16, 69 (1980). [CrossRef]

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