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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 16 — Aug. 15, 1983
  • pp: 2426–2428

Light propagation along periodic metal–dielectric layers

Shojiro Kawakami  »View Author Affiliations


Applied Optics, Vol. 22, Issue 16, pp. 2426-2428 (1983)
http://dx.doi.org/10.1364/AO.22.002426


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Abstract

Analysis and experiments on TE and TM waves along periodically laminated metal–dielectric layers are described; the waves propagate parallel to the layers. Aluminum (Al) and silica (SiO2) are chosen as the metal and the dielectric, respectively. We find that the attenuation for TE waves is much higher than that for TM waves. Typically, αTE/αTM ranges from 103 to 104. Thus, an optical polarizer can be made in a multilayer structure.

© 1983 Optical Society of America

History
Original Manuscript: December 30, 1982
Published: August 15, 1983

Citation
Shojiro Kawakami, "Light propagation along periodic metal–dielectric layers," Appl. Opt. 22, 2426-2428 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-16-2426

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