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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 16 — Aug. 15, 1983
  • pp: 2456–2462

Scattering and absorption of turbid materials determined from reflection measurements. 1: Theory

R. A. J. Groenhuis, H. A. Ferwerda, and J. J. Ten Bosch  »View Author Affiliations


Applied Optics, Vol. 22, Issue 16, pp. 2456-2462 (1983)
http://dx.doi.org/10.1364/AO.22.002456


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Abstract

To allow the determination of scattering and absorption parameters of a turbid material from reflection measurements the relation of these parameters to the reflection has been described by two theoretical approaches. One approach is based on the diffusion theory which has been extended to include anisotropic scattering. This results in a reflection formula in which the scattering and absorption are described by one parameter each. As a second more general approach a Monte Carlo model is applied. Comparison of the results indicates the range of values of the scattering and absorption parameters where the computationally fast diffusion approach is applicable.

© 1983 Optical Society of America

History
Original Manuscript: September 10, 1982
Published: August 15, 1983

Citation
R. A. J. Groenhuis, H. A. Ferwerda, and J. J. Ten Bosch, "Scattering and absorption of turbid materials determined from reflection measurements. 1: Theory," Appl. Opt. 22, 2456-2462 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-16-2456


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