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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 18 — Sep. 15, 1983
  • pp: 2794–2797

Simplified calculation of the effects of jitter on clutter leakage

Norman G. Kulgein  »View Author Affiliations


Applied Optics, Vol. 22, Issue 18, pp. 2794-2797 (1983)
http://dx.doi.org/10.1364/AO.22.002794


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Abstract

A simple analytical solution has been found that enables prediction of the effects of line-of-sight motion of a sensor on clutter leakage after first differencing. The effect of finite footprint size is included, and the crucial importance of the ratio of this quantity to the background correlation length is given. For small motions the clutter leakage as a fraction of the value of background standard deviation is given by the very simple formula 2 [ 1 exp ( L / d ) ], where L is the footprint size, and d is the background correlation length.

© 1983 Optical Society of America

History
Original Manuscript: July 26, 1982
Published: September 15, 1983

Citation
Norman G. Kulgein, "Simplified calculation of the effects of jitter on clutter leakage," Appl. Opt. 22, 2794-2797 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-18-2794


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References

  1. Y. Ikatura et al., Infrared Phys. 14, 17 (1974). [CrossRef]
  2. C. Hester, “Wiener Spectra Data Analysis for Infrared Background Modeling,” Report TE 77-11, U.S. Army Missile and Research Development Command Redstone Arsenal, Ala. (1977).
  3. R. N. Bracewell, The Fourier Transform and its Applications (McGraw-Hill, New York, 1965).
  4. A. T. Maksymowicz et al., “Phenomenology of Thermal Infrared Background Scenes,” Proc. Soc. Photo-Opt. Instrum. Eng. 366, 23 (1981).
  5. A. LaRocca et al., “Handbook of the Statistics of Various Terrain and Water (Ice) Backgrounds From Selected U.S. Locations,” Report 139900-1-X, Environmental Research Institute of Michigan, Ann Arbor (1980).

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