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Applied Optics

Applied Optics


  • Vol. 22, Iss. 2 — Jan. 15, 1983
  • pp: 237–243

Computer-aided speckle pattern interferometry

Suezou Nakadate, Toyohiko Yatagai, and Hiroyoshi Saito  »View Author Affiliations

Applied Optics, Vol. 22, Issue 2, pp. 237-243 (1983)

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An on-line computer system for measuring the deformation of a diffuse object with a speckle interferometer is presented. Methods for evaluating a speckle interferogram using digital image processing techniques are also discussed. The system consists of an interferometric optical setup and a computer–TV image processing facility. A speckle interferogram is generated arithmetically between two digitized speckle patterns before and after deformation of the object. The information about the deformation is extracted by two procedures in analyzing the interferogram: (a) automatic analysis using digital image processing techniques such as gray scale modification, linear spatial filtering, thresholding, and skeletoning; (b) man–machine interactive method for simple high-speed processing of the interferogram using a light pen. The determined fringe order numbers are interpolated and differentiated spatially to give strain, slope, and bending moment of the deformed object. Some examples of processed patterns are presented.

© 1983 Optical Society of America

Original Manuscript: July 6, 1982
Published: January 15, 1983

Suezou Nakadate, Toyohiko Yatagai, and Hiroyoshi Saito, "Computer-aided speckle pattern interferometry," Appl. Opt. 22, 237-243 (1983)

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