Thermal-wave detection and thin-film thickness measurements with laser beam deflection
Applied Optics, Vol. 22, Issue 20, pp. 3169-3176 (1983)
http://dx.doi.org/10.1364/AO.22.003169
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Abstract
A new technique has been developed that employs highly focused laser beams for both generating and detecting thermal waves in the megahertz frequency regime. This technique includes a comprehensive 3-D depth-profiling theoretical model; it has been used to measure the thickness of both transparent and opaque thin films with high spatial resolution. Thickness sensitivities of ±2% over the 500–25,000-Å range have been obtained for Al and SiO2 films on Si substrates.
© 1983 Optical Society of America
Citation
Jon Opsal, Allan Rosencwaig, and David L. Willenborg, "Thermal-wave detection and thin-film thickness measurements with laser beam deflection," Appl. Opt. 22, 3169-3176 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-20-3169
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