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Applied Optics

Applied Optics


  • Vol. 22, Iss. 20 — Oct. 15, 1983
  • pp: 3297–3299

Improvement in the quantum efficiency of silicon photodetectors at near IR wavelengths by edge illumination

C. L. Fan and J. T. Boyd  »View Author Affiliations

Applied Optics, Vol. 22, Issue 20, pp. 3297-3299 (1983)

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The concept of illuminating a silicon photodetector along an edge to increase the light propagation path through the depletion region and thus to increase quantum efficiency at near IR wavelengths is introduced. Quantum efficiency measurements using both a GaAlAs laser and a He–Ne laser are included. These measurements show an improvement in quantum efficiency at λ = 0.83 μm for edge illumination over normal incidence of 75% for a photodiode and of 142% for a MOS capacitor photosensor.

© 1983 Optical Society of America

Original Manuscript: May 2, 1983
Published: October 15, 1983

C. L. Fan and J. T. Boyd, "Improvement in the quantum efficiency of silicon photodetectors at near IR wavelengths by edge illumination," Appl. Opt. 22, 3297-3299 (1983)

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