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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 22 — Nov. 15, 1983
  • pp: 3593–3598

Superresolution of Fourier transform spectroscopy data by the maximum entropy method

S. Kawata, K. Minami, and S. Minami  »View Author Affiliations


Applied Optics, Vol. 22, Issue 22, pp. 3593-3598 (1983)
http://dx.doi.org/10.1364/AO.22.003593


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Abstract

The maximum entropy method (MEM) is applied to the interferogram data obtained using the technique of Fourier transform spectroscopy for estimating its spectrum with a resolution far exceeding the value set by the spectrometer. For emission line data, the MEM process is directly used with the interferogram data in place of the regular Fourier transformation process required in Fourier transform spectroscopy. It produces a spectral estimate with an enhanced resolution. For absorption data with a broad background spectrum, the method is applied to a modified interferogram which corresponds to the Fourier transform of the absorptance spectrum. Two results are presented to demonstrate the power of the technique: for the visible emission spectrum of a spectral, calibration lamp and for the infrared chloroform absorption spectrum. Included in the paper is a discussion of the problems associated with practical use of the MEM.

© 1983 Optical Society of America

History
Original Manuscript: May 20, 1983
Published: November 15, 1983

Citation
S. Kawata, K. Minami, and S. Minami, "Superresolution of Fourier transform spectroscopy data by the maximum entropy method," Appl. Opt. 22, 3593-3598 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-22-3593

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