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Applied Optics

Applied Optics


  • Vol. 22, Iss. 23 — Dec. 1, 1983
  • pp: 3892–3894

Measuring mode propagation losses of integrated optical waveguides: a simple method

Yasuyuki Okamura, Shinji Yoshinaka, and Sadahiko Yamamoto  »View Author Affiliations

Applied Optics, Vol. 22, Issue 23, pp. 3892-3894 (1983)

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A semiautomatic method is described for measuring, fast and accurately, the mode propagation losses of planar or channel waveguides for integrated optical circuits. It involves a video camera aided by a microcomputer, and the real-time measurement is feasible over a broad range from low loss (<1 dB/cm) to high loss (of the order of 102 dB/cm). We examined the propagation properties of several optical waveguides prepared by sputtering or ion migration.

© 1983 Optical Society of America

Original Manuscript: June 15, 1983
Published: December 1, 1983

Yasuyuki Okamura, Shinji Yoshinaka, and Sadahiko Yamamoto, "Measuring mode propagation losses of integrated optical waveguides: a simple method," Appl. Opt. 22, 3892-3894 (1983)

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