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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 22, Iss. 24 — Dec. 15, 1983
  • pp: 4146–4148

Temperature-dependent dispersion of cadmium sulfide thin film in a slab-type optical waveguide

K. Sasaki, T. Shimizu, O. Nonaka, and O. Hamano  »View Author Affiliations


Applied Optics, Vol. 22, Issue 24, pp. 4146-4148 (1983)
http://dx.doi.org/10.1364/AO.22.004146


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Abstract

A previously reported optical guided-wave method for determining the optical constants of high-index thin films has been used to measure the temperature-dependent dispersion in vacuum-evaporated cadmium sulfide thin films. Measurements were carried out over the spectral range from 4579 to 6328 Å using Ar and He–Ne lasers at 18 K, 83 K, and room temperature in an optical cryostat.

© 1983 Optical Society of America

History
Original Manuscript: July 7, 1983
Published: December 15, 1983

Citation
K. Sasaki, T. Shimizu, O. Nonaka, and O. Hamano, "Temperature-dependent dispersion of cadmium sulfide thin film in a slab-type optical waveguide," Appl. Opt. 22, 4146-4148 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-24-4146


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References

  1. K. Sasaki, H. Takahashi, Y. Kudo, N. Suzuki, Appl. Opt. 19, 3018 (1980). [CrossRef] [PubMed]
  2. K. Sasaki, Y. Kudo, H. Watanabe, O. Hamano, Appl. Opt. 20, 3715 (1981). [CrossRef] [PubMed]
  3. K. Sasaki, Y. Kudo, A. Fukuda, H. Awata, O. Hamano, Appl. Opt. 21, 3552 (1982). [CrossRef] [PubMed]
  4. J. Gottesman, W. F. C. Ferguson, J. Opt. Soc. Am. 44, 368 (1954). [CrossRef]
  5. D. W. Langer, J. Appl. Phys. 37, 3530 (1966). [CrossRef]
  6. H. Gobrecht, A. Bartschat, Z. Phys. 156, 131 (1959). [CrossRef]
  7. N. I. Vitrikhovskii, L. F. Gudymenko, A. F. Maznichenko, Sov. Phys. Semicond. 2, 732 (1968).
  8. D. Dutton, Phys. Rev. 112, 758 (1958). [CrossRef]
  9. K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis, Paris, 7–10 June 1983, paper F26.
  10. M. Cardona, G. Harbeke, Phys. Rev. 137, 1467 (1965). [CrossRef]

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