Determination of optical properties of absorbing materials: a generalized scheme
Applied Optics, Vol. 22, Issue 4, pp. 587-591 (1983)
http://dx.doi.org/10.1364/AO.22.000587
Acrobat PDF (493 KB)
Abstract
A generalized reflectance method for determination of optical properties of absorbing materials is developed and compared with other reflectance methods. In the present scheme the specimen is coated with dielectric transparent layer(s) and the reflectance ratios are measured. This novel scheme of specimen preparation and the method of measurement allow the specimen to be free from surface layers and at the same time account for possible effects of surface roughness. It can be applied to a wide variety of materials regardless of their surface conditions and is particularly useful for metals.
© 1983 Optical Society of America
Citation
C. L. Nagendra and G. K. M. Thutupalli, "Determination of optical properties of absorbing materials: a generalized scheme," Appl. Opt. 22, 587-591 (1983)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-22-4-587
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
« Previous Article | Next Article »
OSA is a member of 