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Applied Optics

Applied Optics


  • Vol. 22, Iss. 8 — Apr. 15, 1983
  • pp: 1149–1159

Static-wavelength independent radiation attenuator

Paul L. Csonka  »View Author Affiliations

Applied Optics, Vol. 22, Issue 8, pp. 1149-1159 (1983)

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The static radiation attenuator consists of one or several layers of absorbing material into which randomly distributed holes are drilled. The attenuator needs no moving parts and reduces not only the time averaged but also the instantaneous brightness, and reduction by an arbitrarily large factor can be easily achieved. The transmitted intensity fluctuates randomly as a function of spatial position, but the expected fluctuation can be evaluated and can be made arbitrarily small. Various properties of the device are explored.

© 1983 Optical Society of America

Original Manuscript: October 20, 1982
Published: April 15, 1983

Paul L. Csonka, "Static-wavelength independent radiation attenuator," Appl. Opt. 22, 1149-1159 (1983)

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  1. A device of this type was recently designed by R. O. Tatchyn to be used in conjunction with synchrotron radiation x rays.
  2. J. D. Jackson, Classical Electrodynamics (Wiley, New York, 1962), Chap. 9.
  3. Exposure is defined in Sec. II.G.
  4. It is assumed that σi ≫ λ. To a good approximation the whole beam is normally incident.
  5. Because the effective illuminated area will not deviate by more than a factor of ≈4, even for points near the edges of the illuminated detector area, for points beyond the boundary of the illuminated area the fluctuation can be larger but is of little interest since hardly any photons will arrive there.
  6. Here we assume that each pinhole receives the same amount of exposure. If that is not the case, each has to be weighted according to the exposure it receives.
  7. Diffraction by previous attenuator layers will cause part of the radiation to deviate from normal incidence. This deviation is governed by λ/ri. We continue to assume λ/ri ≪ 1 and neglect it.

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