Abstract
Aluminum–silicon composite films consisting of a mixture of aluminum and silicon particles were produced by electron-beam coevaporation. The reflectivity of samples with ≲33-vol % Si was in good agreement with the Bruggeman theory with no adjustable parameters. No parallel-band absorption peak due to the aluminum was detected analogously to the behavior of microcrystalline aluminum films.
© 1983 Optical Society of America
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