The identification method is based on approximations of the reflection coefficient r by terms of the Bremmer series. One of these supplies an explicit representation of the refractive-index profile n, utilizing the Fourier transform Fr of r. Various procedures for the identification of thin-film systems using fast Fourier transform are derived from this relationship between Fr and n. One main issue of this paper is the determination of jumps within the refractive-index profile. For this purpose a numerical representation of Fr is subjected to waveform analysis. Theoretical and algorithmic aspects of the method are investigated, including a critical discussion in connection with numerical experiments.
© 1983 Optical Society of America
Hans Kaiser and Hans Christoph Kaiser, "Identification of stratified media based on the Bremmer series representation of the reflection coefficient," Appl. Opt. 22, 1337-1345 (1983)