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Applied Optics

Applied Optics


  • Vol. 23, Iss. 1 — Jan. 1, 1984
  • pp: 83–86

Calibration of diode-laser second-derivative modulation spectrometry with a reference cell

Claus Weitkamp  »View Author Affiliations

Applied Optics, Vol. 23, Issue 1, pp. 83-86 (1984)

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Diode-laser second-derivative modulation spectrometry is a simple means of measuring trace concentrations of small molecules in the gas phase. For a setup with a reference cell used both for laser frequency locking and as a concentration standard, the calibration algorithm is developed for the general case of nonvanishing nonlinear terms in the power expansion of Beer’s law in both the sample and reference channel. A practical example is given.

© 1984 Optical Society of America

Original Manuscript: July 2, 1983
Published: January 1, 1984

Claus Weitkamp, "Calibration of diode-laser second-derivative modulation spectrometry with a reference cell," Appl. Opt. 23, 83-86 (1984)

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  1. P. Pokrowsky, W. Herrmann, SPIE Technical Meeting on Optics and Electro Optics, 20–24, Apr. 1981, Washington, D.C., GKSS 81/E/23 (1981).
  2. P. Pokrowsky, Thesis, Universität Hamburg, Germany, 1981; GKSS 81/E/34 (1981).
  3. U. Lenhard, R. N. Schindler, IAMAP Third Scientific Assembly, 17–28 Aug. 1981, Hamburg, Germany, “IAMAP at Hamburg 1981/ICACGP” (1981), p. 89.
  4. C. Weitkamp, Third International Ocean Disposal Symposium, 12–16 Oct. 1981, Woods Hole, Mass., GKSS 81/E/57 (1981).
  5. C. Weitkamp et al., GKSS 83/E/10 (1983).

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