Lateral aberration measurements with a digital Talbot interferometer
Applied Optics, Vol. 23, Issue 11, pp. 1760-1764 (1984)
http://dx.doi.org/10.1364/AO.23.001760
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Abstract
A new technique for computer-based Talbot interferometry is presented. Fast and automatic aberration measurement has been achieved with improved accuracy and sensitivity. Experimental results are given that agree with the results of calculation by ray tracing.
© 1984 Optical Society of America
Citation
Mitsuo Takeda and Seiji Kobayashi, "Lateral aberration measurements with a digital Talbot interferometer," Appl. Opt. 23, 1760-1764 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-11-1760
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