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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 11 — Jun. 1, 1984
  • pp: 1760–1764

Lateral aberration measurements with a digital Talbot interferometer

Mitsuo Takeda and Seiji Kobayashi  »View Author Affiliations


Applied Optics, Vol. 23, Issue 11, pp. 1760-1764 (1984)
http://dx.doi.org/10.1364/AO.23.001760


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Abstract

A new technique for computer-based Talbot interferometry is presented. Fast and automatic aberration measurement has been achieved with improved accuracy and sensitivity. Experimental results are given that agree with the results of calculation by ray tracing.

© 1984 Optical Society of America

History
Original Manuscript: September 15, 1983
Published: June 1, 1984

Citation
Mitsuo Takeda and Seiji Kobayashi, "Lateral aberration measurements with a digital Talbot interferometer," Appl. Opt. 23, 1760-1764 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-11-1760

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