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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 11 — Jun. 1, 1984
  • pp: 1765–1773

Measurement of absolute gradient-index profiles using modulation ellipsometry

Nancy J. Sullo and Duncan T. Moore  »View Author Affiliations


Applied Optics, Vol. 23, Issue 11, pp. 1765-1773 (1984)
http://dx.doi.org/10.1364/AO.23.001765


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Abstract

An ac ellipsometer has been designed and built to study the feasibility of ellipsometric measurement of gradient-index profiles. Faraday effect polarization modulation and a phase-locking detection system are used to monitor spatial changes in index of refraction while absolute index of refraction is determined through simple ellipsometric procedures. This technique is found to be viable for measurement of commonly encountered refractive-index gradients in both glass and infrared transmitting materials.

© 1984 Optical Society of America

History
Original Manuscript: January 23, 1984
Published: June 1, 1984

Citation
Nancy J. Sullo and Duncan T. Moore, "Measurement of absolute gradient-index profiles using modulation ellipsometry," Appl. Opt. 23, 1765-1773 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-11-1765

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