This paper aims to clarify the conditions in which zero reflection from a dielectric film on metal substrate at oblique angles of incidence takes place. The numerical examples with experimental data show that the light absorption characteristics strongly depend on the film thickness. Therefore, it is useful to observe the oblique-incidence reflectance during the film deposition process for rapid and precise calibration of a thickness monitor.
© 1984 Optical Society of America
Original Manuscript: February 13, 1984
Published: June 15, 1984
H. Kitajima, K. Fujita, and H. Cizmic, "Zero reflection from a dielectric film on metal substrate at oblique angles of incidence," Appl. Opt. 23, 1937-1939 (1984)