OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 23, Iss. 12 — Jun. 15, 1984
  • pp: 1946–1949

Low-level photometric scale based on standardized detectors

Tong-Bao Li and Hong Sun  »View Author Affiliations

Applied Optics, Vol. 23, Issue 12, pp. 1946-1949 (1984)

View Full Text Article

Enhanced HTML    Acrobat PDF (471 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



The procedure and the results of realizing a low-level photometric scale down to 1 × 10−6 lx with standardized detectors are described. The detectors are two photomultipliers (one of them operated in the photon counting mode) and two operational amplifier/photodiode combinations. The relative spectral sensitivity of these detectors was modified to closely approximate the V(λ) curve, and the absolute monochromatic irradiance sensitivity at 633 nm was determined using self-calibrated Si photodiodes. The estimated uncertainty of the measurement of illuminance using these standardized detectors is about ±1%. A low-level photometric source that can provide illuminance of 1.5 × 10−1 lx−5 × 10−7 lx or luminance of 3 × 102 cd/m2−2 × 10−3 cd/m2 has been developed. The repeatability of calibrations of the low-level photometers was ±0.3%.

© 1984 Optical Society of America

Original Manuscript: December 22, 1983
Published: June 15, 1984

Tong-Bao Li and Hong Sun, "Low-level photometric scale based on standardized detectors," Appl. Opt. 23, 1946-1949 (1984)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. “Light as an Ecological Factor: II,” Sixteenth Symposium of the British Ecological Society, 26–28 Mar. 1974.
  2. International Lighting Vocabulary, CIE Publication 17 (1970).
  3. Conference Generale des poids et mesures, Sixteenth Compte Rendu (1979–10).
  4. N. Ooba, Res. Electrotech. Lab. No. 675 (Dec.1967).
  5. T.-B. Li, in Proceedings, Tenth International Symposium of Photon-Detectors, IMEKO Secretariat H-1371, P.O.B. 457, Budapest.
  6. E. F. Zalewski, J. Geist, “Silicon Photodiode Absolute Spectral Response Self-Calibration,” Appl. Opt. 19, 1214 (1980). [CrossRef] [PubMed]
  7. J. Geist, E. F. Zalewski, A. R. Schaefer, “Spectral Response Self-Calibration and Interpolation of Silicon Photodiodes,” Appl. Opt. 19, 3795 (1980). [CrossRef] [PubMed]
  8. T.-B. Li, “The Theoretical Analysis and Experimental Results on the Self-Calibration Technique of Silicon Photodiode,” Acta Opt Sinica 2, 452 (1982).
  9. J. Geist, E. Liang, A. R. Schaefer, “Complete Collection of Minority Carriers from the Inversion Layer in Induced Junction Diodes,” J. Appl. Phys. 52, 4879 (1981). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1 Fig. 2 Fig. 3

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited