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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 12 — Jun. 15, 1984
  • pp: 1946–1949

Low-level photometric scale based on standardized detectors

Tong-Bao Li and Hong Sun  »View Author Affiliations


Applied Optics, Vol. 23, Issue 12, pp. 1946-1949 (1984)
http://dx.doi.org/10.1364/AO.23.001946


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Abstract

The procedure and the results of realizing a low-level photometric scale down to 1 × 10−6 lx with standardized detectors are described. The detectors are two photomultipliers (one of them operated in the photon counting mode) and two operational amplifier/photodiode combinations. The relative spectral sensitivity of these detectors was modified to closely approximate the V(λ) curve, and the absolute monochromatic irradiance sensitivity at 633 nm was determined using self-calibrated Si photodiodes. The estimated uncertainty of the measurement of illuminance using these standardized detectors is about ±1%. A low-level photometric source that can provide illuminance of 1.5 × 10−1 lx−5 × 10−7 lx or luminance of 3 × 102 cd/m2−2 × 10−3 cd/m2 has been developed. The repeatability of calibrations of the low-level photometers was ±0.3%.

© 1984 Optical Society of America

History
Original Manuscript: December 22, 1983
Published: June 15, 1984

Citation
Tong-Bao Li and Hong Sun, "Low-level photometric scale based on standardized detectors," Appl. Opt. 23, 1946-1949 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-12-1946

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