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Applied Optics

Applied Optics


  • Vol. 23, Iss. 12 — Jun. 15, 1984
  • pp: 1986–1988

Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatings

Gregory J. Exarhos and Walter T. Pawlewicz  »View Author Affiliations

Applied Optics, Vol. 23, Issue 12, pp. 1986-1988 (1984)

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Raman spectroscopy can be used to characterize the rutile/anatase phase composition of TiO2 layers in all-dielectric filters and reflectors of arbitrary design. No special specimen preparation is necessary. Interference effects can enhance Raman scattering compared to single-layer coatings of the same total TiO2 thickness.

© 1984 Optical Society of America

Original Manuscript: January 21, 1984
Published: June 15, 1984

Gregory J. Exarhos and Walter T. Pawlewicz, "Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatings," Appl. Opt. 23, 1986-1988 (1984)

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  1. W. T. Pawlewicz, G. J. Exarhos, W. E. Conaway, “Structural Characterization of TiO2 Optical Coatings by Raman Spectroscopy,” Appl. Opt. 22, 1837 (1983). [CrossRef] [PubMed]
  2. W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

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