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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 12 — Jun. 15, 1984
  • pp: 1986–1988

Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatings

Gregory J. Exarhos and Walter T. Pawlewicz  »View Author Affiliations


Applied Optics, Vol. 23, Issue 12, pp. 1986-1988 (1984)
http://dx.doi.org/10.1364/AO.23.001986


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Abstract

Raman spectroscopy can be used to characterize the rutile/anatase phase composition of TiO2 layers in all-dielectric filters and reflectors of arbitrary design. No special specimen preparation is necessary. Interference effects can enhance Raman scattering compared to single-layer coatings of the same total TiO2 thickness.

© 1984 Optical Society of America

History
Original Manuscript: January 21, 1984
Published: June 15, 1984

Citation
Gregory J. Exarhos and Walter T. Pawlewicz, "Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatings," Appl. Opt. 23, 1986-1988 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-12-1986

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