Raman spectroscopy can be used to characterize the rutile/anatase phase composition of TiO2 layers in all-dielectric filters and reflectors of arbitrary design. No special specimen preparation is necessary. Interference effects can enhance Raman scattering compared to single-layer coatings of the same total TiO2 thickness.
© 1984 Optical Society of America
Original Manuscript: January 21, 1984
Published: June 15, 1984
Gregory J. Exarhos and Walter T. Pawlewicz, "Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatings," Appl. Opt. 23, 1986-1988 (1984)