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Applied Optics

Applied Optics


  • Vol. 23, Iss. 14 — Jul. 15, 1984
  • pp: 2386–2392

Development of a flat-field grazing-incidence XUV spectrometer and its application in picosecond XUV spectroscopy

Noboru Nakano, Hiroto Kuroda, Toshiaki Kita, and Tatsuo Harada  »View Author Affiliations

Applied Optics, Vol. 23, Issue 14, pp. 2386-2392 (1984)

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A new type of grazing-incidence spectrometer with a flat focal field is developed, and XUV spectroscopy in the extreme ultraviolet region ranging from 15 to 200 Å is carried out. Soft x-ray line spectra emitted from picosecond laser plasmas of aluminum and iron targets are measured and good resolutions are obtained in the XUV region. The spectral regions of detection are extended to shorter wavelengths (15 Å) using a finer spaced grating. Computational studies on x-ray spectra are also performed taking into account the transient characteristics of picosecond laser-produced plasmas; the importance of the transient treatment is clearly shown. This type of soft x-ray spectrometer should be useful for time-resolved picosecond soft x-ray spectroscopy.

© 1984 Optical Society of America

Original Manuscript: January 5, 1984
Published: July 15, 1984

Noboru Nakano, Hiroto Kuroda, Toshiaki Kita, and Tatsuo Harada, "Development of a flat-field grazing-incidence XUV spectrometer and its application in picosecond XUV spectroscopy," Appl. Opt. 23, 2386-2392 (1984)

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  1. R. J. Fonck, A. T. Ramsey, R. V. Yelle, “Multichannel Grazing-Incidence Spectrometer for Plasma Impurity Diagnosis: SPRED,” Appl. Opt. 21, 2115 (1982). [CrossRef] [PubMed]
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