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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 16 — Aug. 15, 1984
  • pp: 2752–2759

Three-reflection halfwave and quarterwave retarders using dielectric-coated metallic mirrors

T. F. Thonn and R. M. A. Azzam  »View Author Affiliations


Applied Optics, Vol. 23, Issue 16, pp. 2752-2759 (1984)
http://dx.doi.org/10.1364/AO.23.002752


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Abstract

A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that a specified net phase retardance (and/or a net relative amplitude attenuation) between the p and s polarizations is achieved after three reflections from a symmetrical arrangement of three mirrors that maintain collinearity of the input and output beams. Examples are presented of halfwave and quarterwave retarders (HWR and QWR) that use a ZnS–Ag film–substrate system at the CO2-laser wavelength λ = 10.6 μm. The equal net reflectances for the p and s polarizations are computed and found to be high (above 90%) for most designs. Sensitivity of the designs (deviation of the magnitude and phase of the ratio of net complex p and s reflection coefficients from design specifications) to small film-thickness and angle-of-incidence errors is examined, and useful operation over a small wavelength range (10–11 μm) is demonstrated.

© 1984 Optical Society of America

History
Original Manuscript: April 16, 1984
Published: August 15, 1984

Citation
T. F. Thonn and R. M. A. Azzam, "Three-reflection halfwave and quarterwave retarders using dielectric-coated metallic mirrors," Appl. Opt. 23, 2752-2759 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-16-2752


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References

  1. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), p. 371.
  2. R. M. A. Azzam, A. R. M. Zaghloul, N. M. Bashara, “Ellipsometric Function of a Film-Substrate System: Applications to the Design of Reflection-Type Optical Devices and to Ellipsometry,” J. Opt. Soc. Am. 65, 252 (1975). [CrossRef]
  3. A. R. M. Zaghloul, R. M. A. Azzam, N. M. Bashara, “Design of Film–Substrate Single-Reflection Retarders,” J. Opt. Soc. Am. 65, 1043 (1975). [CrossRef]
  4. A. R. M. Zaghloul, R. M. A. Azzam, N. M. Bashara, “An Angle-of-Incidence Tunable, SiO2–Si (Film–Substrate) Reflection Retarder for the UV Mercury Line λ = 2537 Å,” Opt. Commun. 14, 260 (1975). [CrossRef]
  5. A. R. M. Zaghloul, R. M. A. Azzam, N. M. Bashara, “SiO2–Si Film–Substrate Reflection Retarders for Different Mercury Spectral Lines,” Opt. Eng. 17, 180 (1978). [CrossRef]
  6. S. Kawabata, M. Suzuki, “MgF2–Ag Tunable Reflection Retarder,” Appl. Opt. 19, 484 (1980). [CrossRef] [PubMed]
  7. R. M. A. Azzam, M. E. R. Khan, “Single-Reflection Film–Substrate Halfwave Retarders with Nearly Stationary Reflection Properties over a Wide Range of Incidence Angles,” J. Opt. Soc. Am. 73, 160 (1983). [CrossRef]
  8. W. H. Southwell, “Multilayer Coatings Producing 90° Phase Change,” Appl. Opt. 18, 1875 (1979). [CrossRef] [PubMed]
  9. J. H. Apfel, “Graphical Method to Design Multilayer Phase Retarders,” Appl. Opt. 20, 1024 (1981). [CrossRef] [PubMed]
  10. J. H. Apfel, “Phase Retardance of Periodic Multilayer Mirrors,” Appl. Opt. 21, 733 (1982). [CrossRef] [PubMed]
  11. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), Sec. 4.3.
  12. R. M. A. Azzam, M. E. R. Khan, “Polarization-Preserving Single-Layer-Coated Beam Displacers and Axicons,” Appl. Opt. 21, 3314 (1982). [CrossRef] [PubMed]
  13. G. W. Stagg, A. H. El-Abiad, Computer Methods in Power System Analysis (McGraw-Hill, New York, 1968), p. 249.

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