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Applied Optics

Applied Optics


  • Vol. 23, Iss. 16 — Aug. 15, 1984
  • pp: 2760–2762

Birefringence measurements of thin dielectric films by the prism coupler method

Gervais Leclerc and Arthur Yelon  »View Author Affiliations

Applied Optics, Vol. 23, Issue 16, pp. 2760-2762 (1984)

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A convenient and accurate method for determining the birefringence of a thin dielectric film is presented. In this technique, the film is deposited directly onto the base of a prism, thus forming a leaky waveguide, and a converging laser beam is coupled into the film to excite simultaneously many leaky modes. We present an error analysis to evaluate the effect of each source of uncertainty on the value of the birefringence.

© 1984 Optical Society of America

Original Manuscript: April 16, 1984
Published: August 15, 1984

Gervais Leclerc and Arthur Yelon, "Birefringence measurements of thin dielectric films by the prism coupler method," Appl. Opt. 23, 2760-2762 (1984)

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