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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 16 — Aug. 15, 1984
  • pp: 2784–2787

Determination of absorption coefficients of thick semiconductor samples using photoacoustic spectroscopy

J. Fesquet, B. Girault, and M. D. M. Razafindrandriatsimaniry  »View Author Affiliations


Applied Optics, Vol. 23, Issue 16, pp. 2784-2787 (1984)
http://dx.doi.org/10.1364/AO.23.002784


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Abstract

A method of measurement of the optical absorption coefficient for a semiconductor sample is given, based on the simplified pattern by Rosencwaig and Gersho in the particular case of thick samples. This method allows us to deduce directly the absorption coefficient from photoacoustic amplitude signal measurement, whatever the incident light modulation frequency. The experimental results obtained from thicker sample of GaP (0.2–1 mm) are compared with the results given by classical optical methods.

© 1984 Optical Society of America

History
Original Manuscript: February 2, 1984
Published: August 15, 1984

Citation
J. Fesquet, B. Girault, and M. D. M. Razafindrandriatsimaniry, "Determination of absorption coefficients of thick semiconductor samples using photoacoustic spectroscopy," Appl. Opt. 23, 2784-2787 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-16-2784

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