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Applied Optics

Applied Optics


  • Vol. 23, Iss. 16 — Aug. 15, 1984
  • pp: 2835–2842

Analysis of 2-D distributions of similar patterns

Klaus Nottbohm and Leo C. M. De Maeyer  »View Author Affiliations

Applied Optics, Vol. 23, Issue 16, pp. 2835-2842 (1984)

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Various analytical or diagnostic techniques (e.g., evaluation of 2-D electrophoretograms, discrimination, and counting of objects) deal with pictures containing many similar patterns or objects and a few which are dissimilar. In this paper an efficient method is described which analyzes such pictures. It proceeds in three stages: removal of film background, separation into regions enclosing a single object or pattern, and classification of these regions into groups containing objects that are similar. The classification is based on moment analysis of the separated regions. The limitations due to noise (film granularity and fluctuations in object shape) on the selection of moment orders are discussed. Using selected integral functions (moments) and a corresponding choice of variables for the representation of 2-D space, adapted to the particular characteristics of the patterns to be classified, leads to a fast method for discriminating patterns that are difficult to distinguish by visual inspection because of their low texture content. The intended application of the method is automated data extraction from 2-D electrophoretograms. The performance of the procedure is shown in two examples.

© 1984 Optical Society of America

Original Manuscript: September 16, 1983
Published: August 15, 1984

Klaus Nottbohm and Leo C. M. De Maeyer, "Analysis of 2-D distributions of similar patterns," Appl. Opt. 23, 2835-2842 (1984)

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