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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 18 — Sep. 15, 1984
  • pp: 3036–3037

Phase conventions in thin film optics and ellipsometry

Eberhard Spiller  »View Author Affiliations


Applied Optics, Vol. 23, Issue 18, pp. 3036-3037 (1984)
http://dx.doi.org/10.1364/AO.23.003036


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History
Original Manuscript: March 30, 1984
Published: September 15, 1984

Citation
Eberhard Spiller, "Phase conventions in thin film optics and ellipsometry," Appl. Opt. 23, 3036-3037 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-18-3036


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References

  1. R. H. Müller, “Definitions and Conventions in Ellipsometry,” Surface Sci. 16, 14 (1969). [CrossRef]
  2. J. M. Bennett, H. E. Bennett, “Polarization,” in Handbook of Optics, W. G. Driscoll, W. Vaughan, Eds. (McGraw-Hill, New York, 1978), Chap. 10.
  3. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
  4. Any textbook on thin-film optics, for example, P.S. Heavens, Optical Properties of Thin Films (Dover, New York, 1965); A. Vasicek, Optics of Thin Films (North-Holland, Amsterdam, 1960); H. A. Macleod, Thin-Film Optical Filters (Elsevier, New York, 1969); M. Born, E. Wolf, Principles of Optics (Pergamon, London, 1975); P. H. Berning, “Theory and Calculations of Optical Thin films,” Phys. Thin Films 1, 69 (1963).

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