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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 22 — Nov. 15, 1984
  • pp: 3983–3989

Reflectivity, rotation, and ellipticity of magnetooptic film structures

Gerard J. Sprokel  »View Author Affiliations


Applied Optics, Vol. 23, Issue 22, pp. 3983-3989 (1984)
http://dx.doi.org/10.1364/AO.23.003983


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Abstract

A general relation is derived between the incident, reflected, and transmitted waves for a multilayer structure containing one or more layers characterized by a magnetooptic dielectric tensor. The method consists of formulating the characteristic matrix for each layer and evaluating the matrix products numerically. From the resulting matrix, desired quantities such as reflectivity, transmission, rotation, and ellipticity are obtained.

© 1984 Optical Society of America

History
Original Manuscript: April 20, 1984
Published: November 15, 1984

Citation
Gerard J. Sprokel, "Reflectivity, rotation, and ellipticity of magnetooptic film structures," Appl. Opt. 23, 3983-3989 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-22-3983


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References

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