The full near-field Lorenz-Mie theory is described and applied to Gabor microholography to predict the intensities that are recorded on a microholographic plate. The influence of light polarization and the complex refractive index are discussed. Then, the full near-field Lorenz-Mie theory is compared with the Fraunhofer, the Fresnel, and the far-field Lorenz-Mie theories. Criteria of validity of the simplified theories are deduced.
© 1984 Optical Society of America
Original Manuscript: January 25, 1984
Published: November 15, 1984
F. Slimani, G. Grehan, G. Gouesbet, and D. Allano, "Near-field Lorenz-Mie theory and its application to microholography," Appl. Opt. 23, 4140-4148 (1984)