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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 3 — Feb. 1, 1984
  • pp: 425–435

Fourier transform measurement of self-, N2-, and O2-broadening of N2O lines: temperature dependence of linewidths

Nelly Lacome, Armand Levy, and Guy Guelachvili  »View Author Affiliations


Applied Optics, Vol. 23, Issue 3, pp. 425-435 (1984)
http://dx.doi.org/10.1364/AO.23.000425


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Abstract

The high-resolution FT interferometer of the Laboratoire d’Infrarouge at Orsay has been used to investigate the broadening of N2O lines in the 4- and 8-μm spectral regions. All data were taken at both room temperature and 220 K. The uncertainty of the measured values of linewidths was estimated to <4%. From these data, the exponent n of the temperature dependence of linewidths was experimentally determined for the first time, for the systems N2O–N2O, N2O–N2, and N2O–O2. In the first two cases, it was shown that n is nearly J-independent, whereas it seems to vary linearly for N2O–O2. Finally the values of N2O air-broadened linewidths were derived for the two temperatures 295 K and 220 K representing the upper and lower boundaries of middle atmosphere temperatures.

© 1984 Optical Society of America

History
Original Manuscript: August 9, 1983
Published: February 1, 1984

Citation
Nelly Lacome, Armand Levy, and Guy Guelachvili, "Fourier transform measurement of self-, N2-, and O2-broadening of N2O lines: temperature dependence of linewidths," Appl. Opt. 23, 425-435 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-3-425


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