A new approach using the diffraction method of linear superposition is used for the analytical description of an imperfect Fabry-Perot etalon. Derived simple relations for the transfer coefficients of a corrugated thin-film system may find a broader field of application.
© 1984 Optical Society of America
Ivan Prikryl, "Analytical description of an imperfect Fabry-Perot etalon," Appl. Opt. 23, 621-627 (1984)