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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 4 — Feb. 15, 1984
  • pp: 637–640

Techniques for measuring 1-μm diam Gaussian beams

Donald K. Cohen, Blake Little, and Frank S. Luecke  »View Author Affiliations


Applied Optics, Vol. 23, Issue 4, pp. 637-640 (1984)
http://dx.doi.org/10.1364/AO.23.000637


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Abstract

This paper reviews various techniques for measuring the diameter of Gaussian beams and, in particular, those of ~1-μm diam. A description of measurement techniques for nonideal conditions is also included. A novel ruling used for beam-size measurement is discussed.

© 1984 Optical Society of America

History
Original Manuscript: August 18, 1983
Published: February 15, 1984

Citation
Donald K. Cohen, Blake Little, and Frank S. Luecke, "Techniques for measuring 1-μm diam Gaussian beams," Appl. Opt. 23, 637-640 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-4-637

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