An in situ relative intensity calibration technique for x-ray films is described. This is based on film exposure measurements of an x-ray spectrum transmitted through a step-wedge absorption filter. As an example, characteristic curves for Kodak SC5 film have been obtained. The technique was used in the study of laser-produced plasmas.
© 1984 Optical Society of America
Daniel Pasini, Andrew Ng, and A. J. Barnard, "In-situ calibration technique for x-ray films," Appl. Opt. 23, 762-766 (1984)