An all-fiber ellipsometer is constructed which uses a polarization-maintaining single-mode fiber as the polarization modulator. It is demonstrated that the all-fiber ellipsometer can be used to determine the optical constants of materials and as a surface state sensor.
© 1984 Optical Society of America
Original Manuscript: October 11, 1983
Published: April 1, 1984
Toshihiko Yoshino and Kiyoshi Kurosawa, "All-fiber ellipsometry," Appl. Opt. 23, 1100-1102 (1984)