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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 7 — Apr. 1, 1984
  • pp: 1100–1102

All-fiber ellipsometry

Toshihiko Yoshino and Kiyoshi Kurosawa  »View Author Affiliations


Applied Optics, Vol. 23, Issue 7, pp. 1100-1102 (1984)
http://dx.doi.org/10.1364/AO.23.001100


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Abstract

An all-fiber ellipsometer is constructed which uses a polarization-maintaining single-mode fiber as the polarization modulator. It is demonstrated that the all-fiber ellipsometer can be used to determine the optical constants of materials and as a surface state sensor.

© 1984 Optical Society of America

History
Original Manuscript: October 11, 1983
Published: April 1, 1984

Citation
Toshihiko Yoshino and Kiyoshi Kurosawa, "All-fiber ellipsometry," Appl. Opt. 23, 1100-1102 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-7-1100


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References

  1. R. M. A. Azzam, N. N. Bashara, Ellipsometry and Polarized Light (North Holland, Amsterdam, 1977).
  2. D. E. Gray, Ed., American Institute of Physics Handbook (McGraw-Hill, New York, 1972), pp. 6–124.
  3. D. M. Kolb, J. Opt. Soc. Am. 62, 599 (1972). [CrossRef]

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