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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 23, Iss. 7 — Apr. 1, 1984
  • pp: 975–976

Spectral emissivity of tungsten: analytic expressions for the 340-nm to 2.6-μm spectral region

Russell M. Pon and Jan P. Hessler  »View Author Affiliations


Applied Optics, Vol. 23, Issue 7, pp. 975-976 (1984)
http://dx.doi.org/10.1364/AO.23.000975


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No abstract available.

History
Original Manuscript: July 25, 1983
Published: April 1, 1984

Citation
Russell M. Pon and Jan P. Hessler, "Spectral emissivity of tungsten: analytic expressions for the 340-nm to 2.6-μm spectral region," Appl. Opt. 23, 975-976 (1984)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-23-7-975


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References

  1. L. F. Costa, K. D. Mielenz, F. Grum, Optical Radiation Measurements. Vol. 3. Measurement of Photoluminescence, K. D. Mielenz, Ed. (Academic, New York, 1982), pp. 139–174.
  2. R. D. Larrabee, J. Opt. Soc. Am. 49, 619 (1959). [CrossRef]
  3. J. C. DeVos, Physica 20, 690 (1954). [CrossRef]
  4. To perform this least-squares analysis, a program capable of accepting a multidimensioned vector as the independent variable was required. Such a program has been developed by A. H. Heiss, now of Bruker Instruments, Inc., and J. P. Hessler of Argonne National Laboratory.

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