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Applied Optics

Applied Optics


  • Vol. 23, Iss. 7 — Apr. 1, 1984
  • pp: 975–976

Spectral emissivity of tungsten: analytic expressions for the 340-nm to 2.6-μm spectral region

Russell M. Pon and Jan P. Hessler  »View Author Affiliations

Applied Optics, Vol. 23, Issue 7, pp. 975-976 (1984)

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No abstract available.

Original Manuscript: July 25, 1983
Published: April 1, 1984

Russell M. Pon and Jan P. Hessler, "Spectral emissivity of tungsten: analytic expressions for the 340-nm to 2.6-μm spectral region," Appl. Opt. 23, 975-976 (1984)

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  1. L. F. Costa, K. D. Mielenz, F. Grum, Optical Radiation Measurements. Vol. 3. Measurement of Photoluminescence, K. D. Mielenz, Ed. (Academic, New York, 1982), pp. 139–174.
  2. R. D. Larrabee, J. Opt. Soc. Am. 49, 619 (1959). [CrossRef]
  3. J. C. DeVos, Physica 20, 690 (1954). [CrossRef]
  4. To perform this least-squares analysis, a program capable of accepting a multidimensioned vector as the independent variable was required. Such a program has been developed by A. H. Heiss, now of Bruker Instruments, Inc., and J. P. Hessler of Argonne National Laboratory.

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