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Applied Optics

Applied Optics


  • Vol. 24, Iss. 11 — Jun. 1, 1985
  • pp: 1599–1603

Fully compensated Michelson interferometer of fixed-path difference

G. Thuillier and Gordon G. Shepherd  »View Author Affiliations

Applied Optics, Vol. 24, Issue 11, pp. 1599-1603 (1985)

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A Michelson interferometer of fixed-path difference, capable of scanning over only one fringe, has been shown to be useful for the measurement of Doppler shifts from isolated emission lines. It is straightforward to field widen this type of configuration, but if different wavelengths are to be selected, the field widening must be achromatic. Further, for Doppler shift measurement, one requires a path difference that is highly stable with respect to temperature. The generalized requirements for meeting all these conditions are set out and a configuration that satisfies them is described. Sample characteristics are given for a number of different systems.

© 1985 Optical Society of America

Original Manuscript: August 10, 1984
Published: June 1, 1985

G. Thuillier and Gordon G. Shepherd, "Fully compensated Michelson interferometer of fixed-path difference," Appl. Opt. 24, 1599-1603 (1985)

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  1. R. L. Hilliard, G. G. Shepherd, “Wide-Angle Michelson Interferometer for Measuring Doppler Line Widths,” J. Opt. Soc. Am. 56, 362 (1966). [CrossRef]
  2. A. M. Title, H. E. Ramsey, “Improvements in Birefringent Filters. 6: Analog Birefringent Elements,” Appl. Opt. 19, 2046 (1980). [CrossRef] [PubMed]
  3. G. G. Shepherd et al., “WAMDII: Wide Angle Michelson Doppler Imaging Interferometer for Spacelab,” Appl. Opt. 24, 1571 (1985). [CrossRef] [PubMed]

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