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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 11 — Jun. 1, 1985
  • pp: 1689–1692

Total internal reflection microscopy: inspection of surfaces of high bulk scatter materials

S. N. Jabr  »View Author Affiliations


Applied Optics, Vol. 24, Issue 11, pp. 1689-1692 (1985)
http://dx.doi.org/10.1364/AO.24.001689


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Abstract

The technique of total internal reflection microscopy (TIRM) introduced by P. Temple for inspection of the surface structure of transparent substrates is extended here for use with materials exhibiting high bulk scatter. A strong dependence of scratch illumination on the angle between scratches and the S polarization direction is observed and explained via a simple model.

© 1985 Optical Society of America

History
Original Manuscript: January 19, 1985
Published: June 1, 1985

Citation
S. N. Jabr, "Total internal reflection microscopy: inspection of surfaces of high bulk scatter materials," Appl. Opt. 24, 1689-1692 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-11-1689

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