Abstract
The technique of total internal reflection microscopy (TIRM) introduced by P. Temple for inspection of the surface structure of transparent substrates is extended here for use with materials exhibiting high bulk scatter. A strong dependence of scratch illumination on the angle between scratches and the S polarization direction is observed and explained via a simple model.
© 1985 Optical Society of America
Full Article | PDF ArticleMore Like This
P. A. Temple
Appl. Opt. 20(15) 2656-2664 (1981)
Laurent Helden, Elena Eremina, Norbert Riefler, Christopher Hertlein, Clemens Bechinger, Yuri Eremin, and Thomas Wriedt
Appl. Opt. 45(28) 7299-7308 (2006)
Giovanni Volpe, Thomas Brettschneider, Laurent Helden, and Clemens Bechinger
Opt. Express 17(26) 23975-23985 (2009)