Détermination des constantes optiques n et k de materiaux faiblement absorbants
Applied Optics, Vol. 24, Issue 12, pp. 1808-1814 (1985)
http://dx.doi.org/10.1364/AO.24.001808
Acrobat PDF (678 KB)
Abstract
Two simple optical-constants determination methods of weakly absorbing thin films are proposed. They rely only on the measurement of the layer thickness and of the spectral transmission curve. As an example of use the optical constants of ZnS and ThF4 are determined in the 4–11-µm infrared range.
© 1985 Optical Society of America
Citation
J. Mouchart, G. Lagier, and B. Pointu, "Détermination des constantes optiques n et k de materiaux faiblement absorbants," Appl. Opt. 24, 1808-1814 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-12-1808
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
« Previous Article | Next Article »
OSA is a member of 