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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 15 — Aug. 1, 1985
  • pp: 2437–2441

Sources of systematic errors in line intensities

John H. Shaw, Nengkuan Tu, and Donald L. Agresta  »View Author Affiliations


Applied Optics, Vol. 24, Issue 15, pp. 2437-2441 (1985)
http://dx.doi.org/10.1364/AO.24.002437


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Abstract

Line intensities obtained from absorption lines in or near the linear region of the curve of growth depend on the values implicitly or explicitly assumed for the linewidths and spectral resolution. These effects are illustrated by analyzing simulated weak Lorentz-shaped lines. Line intensities obtained by assuming an incorrect linewidth or spectral resolution contain systematic errors.

© 1985 Optical Society of America

History
Original Manuscript: February 4, 1985
Published: August 1, 1985

Citation
John H. Shaw, Nengkuan Tu, and Donald L. Agresta, "Sources of systematic errors in line intensities," Appl. Opt. 24, 2437-2441 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-15-2437


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References

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  7. E. Lobsiger, K. F. Kunzi, H. U. Dütsch, “Comparison of Stratospheric Ozone Profiles Retrieved from Microwave-Radiometer and Dobson-Spectrometer Data,” J. Atmos. Terr. Phys. 46, 799 (1984). [CrossRef]
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