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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 15 — Aug. 1, 1985
  • pp: 2456–2459

Optimization of fringe spacing in a digital flatness test

Takeshi Hatsuzawa  »View Author Affiliations


Applied Optics, Vol. 24, Issue 15, pp. 2456-2459 (1985)
http://dx.doi.org/10.1364/AO.24.002456


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Abstract

The optimum condition of fringe spacing in a flatness test using digital fringe analysis is described. This condition is based on information theory and maximizes the amount of measurement information in a fringe image. First, the relationship between resolution and data sampling number is discussed. Then the optimum fringe spacing is derived using the concept of average information—entropy. Numerical analysis to evaluate fringe spacing in FFT fringe analysis is performed using the derived condition. An experiment is carried out with a liquid level flatness tester and its results show high space frequency resolution superiority at the condition.

© 1985 Optical Society of America

History
Original Manuscript: February 28, 1985
Published: August 1, 1985

Citation
Takeshi Hatsuzawa, "Optimization of fringe spacing in a digital flatness test," Appl. Opt. 24, 2456-2459 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-15-2456


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References

  1. W. W. Macy, “Two-Dimensional Fringe-Pattern Analysis,” Appl. Opt. 22, 3898 (1983). [CrossRef] [PubMed]
  2. A. I. Khinchin, Mathematical Foundations of Information Theory (Dover, New York, 1957), p. 3.
  3. E. Shannon, W. Weaver, The Mathematical Theory of Communication (U. Illinois Press, Urbana, 1980), p. 89.
  4. M. Takeda, H. Ina, S. Kobayashi, “Fourier-Transform Method of Fringe-Pattern Analysis for Computer-Based Topography and Interferometry,” J. Opt. Soc. Am. 72, 156 (1982). [CrossRef]
  5. Y. Yokoyama, J. Matsuda, “Trial Manufacture of Flatness Tester,” Proc. Jpn. Soc. Prec. Eng. S.46, 305 (1971), in Japanese.

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