OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 24, Iss. 18 — Sep. 15, 1985
  • pp: 3053–3058

Phase-shifting speckle interferometry

Katherine Creath  »View Author Affiliations

Applied Optics, Vol. 24, Issue 18, pp. 3053-3058 (1985)

View Full Text Article

Enhanced HTML    Acrobat PDF (1020 KB) Open Access

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



Speckle patterns have high frequency phase data, which make it difficult to find the absolute phase of a single speckle pattern; however, the phase of the difference between two correlated speckle patterns can be determined. This is done by applying phase-shifting techniques to speckle interferometry, which will quantitatively determine the phase of double-exposure speckle measurements. The technique uses computer control to take data and calculate phase without an intermediate recording step. The randomness of the speckle causes noisy data points which are removed by data processing routines. One application of this technique is finding the phase of deformations, where up to ten waves of wavefront deformation can easily be measured. Results of deformations caused by tilt of a metal plate and a disbond in a honeycomb structure brazed to an aluminum plate are shown.

© 1985 Optical Society of America

Original Manuscript: March 22, 1985
Published: September 15, 1985

Katherine Creath, "Phase-shifting speckle interferometry," Appl. Opt. 24, 3053-3058 (1985)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. J. N. Butters, J. A. Leendertz, “Speckle Pattern and Holo graphic Techniques in Engineering Metrology,” Opt. Laser Technol. 3, 26 (1971). [CrossRef]
  2. R. Jones, C. Wykes, “General Parameters for the Design and Optimization of Electronic Speckle Pattern Interferometers,” Opt. Acta 28, 949 (1981). [CrossRef]
  3. C. Wykes, “Use of Electronic Speckle Pattern Interferometry (ESPI) in the Measurement of Static and Dynamic Surface Displacements,” Opt. Eng. 21, 400 (1982). [CrossRef]
  4. R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. P., London, 1983).
  5. G. Å. Slettemoen, “General Analysis of Fringe Contrast in Electronic Speckle Pattern Interferometry,” Opt. Acta 26, 313 (1979). [CrossRef]
  6. O. J. Løkberg, “Advances and Applications of Electronic Speckle Pattern Interferometery (ESPI),” Proc. Soc. Photo-Opt. Instrum. Eng. 215, 92 (1980).
  7. J. C. Wyant et al., “An Optical Profilometer for Surface Characterization of Magnetic Media,” ASLE Trans. 27, 101 (1984). [CrossRef]
  8. P. Hariharan, Optical Holography (Cambridge U. P., London, 1984).
  9. P. Hariharan, B. F. Oreb, N. Brown, “A Digital Phase-Measurement System for Real-Time Holographic Interferometry,” Opt. Commun. 41, 393 (1982). [CrossRef]
  10. K. Creath, “Digital Speckle Pattern Interferometry (DSPI) Using a 100 × 100 Imaging Array,” Proc. Soc. Photo-Opt. Instrum. Eng. 501, 292 (1984).
  11. P. Carré, “Installation et utilisation du compateur photoelectrique et interferential du Bureau International des Poids et Mesures,” Metrologia 2, 13(1966). [CrossRef]
  12. K. Creath, Y.-Y. Cheng, J. C. Wyant, “Contouring Aspheric Surfaces Using Two-Wavelength Phase-Shifting Interferometry,” to be published in Opt. Acta.32, (1985). [CrossRef]
  13. J. W. Goodman, “Statistical Properties of Laser Speckle Patterns,” in Laser Speckle and Related Phenomena, J. C. Dainty, Ed. (Springer-Verlag, Berlin, 1975). [CrossRef]
  14. Å. Slettemoen, J. C. Wyant, “Maximal Fraction of Accepted Measurements in Phase-Shifting Speckle Interferometry: a Theoretical Study,” to be published in J. Opt. Soc. Am. A2 (1985).
  15. B. R. Frieden, “Some Statistical Properties of the Median Window,” Proc. Soc. Photo-Opt. Instrum. Eng. 373, 219 (1981).
  16. K. Creath, “Phase-Shifting Speckle Interferometry,” Proc. Soc. Photo-Opt. Instrum. Eng.556, in press (1985).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1 Fig. 2 Fig. 3
Fig. 4 Fig. 5

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited