No abstract available.
Original Manuscript: October 30, 1984
Published: January 15, 1985
Jerry Edelstein, Michael C. Hettrick, Stanley Mrowka, Patrick Jelinsky, and Christopher Martin, "Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering; erratum," Appl. Opt. 24, 153-153 (1985)