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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 2 — Jan. 15, 1985
  • pp: 179–184

Rotation-invariant pattern recognition using optimum feature extraction

Ronald Wu and Henry Stark  »View Author Affiliations


Applied Optics, Vol. 24, Issue 2, pp. 179-184 (1985)
http://dx.doi.org/10.1364/AO.24.000179


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Abstract

In this paper we consider the problem of detecting a target regardless of its orientation when it is known that the target must be from one of two classes. We assume significant random intraclass variability, a complication which requires techniques from statistical pattern recognition for amelioration. The Foley-Sammon transformation for selecting optimum features from random training samples is used to solve the problem.

© 1985 Optical Society of America

History
Original Manuscript: July 27, 1984
Published: January 15, 1985

Citation
Ronald Wu and Henry Stark, "Rotation-invariant pattern recognition using optimum feature extraction," Appl. Opt. 24, 179-184 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-2-179

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