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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 24, Iss. 2 — Jan. 15, 1985
  • pp: 185–188

Automated phase-measuring profilometry: a phase mapping approach

V. Srinivasan, H. C. Liu, and Maurice Halioua  »View Author Affiliations


Applied Optics, Vol. 24, Issue 2, pp. 185-188 (1985)
http://dx.doi.org/10.1364/AO.24.000185


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Abstract

When a sinusoidal grating is projected on either a reference plane or a diffuse object to be measured, every point along a line normal to the grating lines, on the reference plane as well as the object, can be characterized by a unique phase value. By measuring this phase accurately using phase modulation methods and by determining points on the reference plane and the object having identical phases, it is shown that the object height can be computed. A working system requires a projector, a translatable sinusoidal grating, and a detector array interfaced to a microcomputer. Results of measurements on diffuse test objects are described and errors are analyzed.

© 1985 Optical Society of America

History
Original Manuscript: June 20, 1984
Published: January 15, 1985

Citation
V. Srinivasan, H. C. Liu, and Maurice Halioua, "Automated phase-measuring profilometry: a phase mapping approach," Appl. Opt. 24, 185-188 (1985)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-24-2-185

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